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AM29F400B
4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS 5.0 Volt-only Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
s Single power supply operation -- 5.0 volt-only operation for read, erase, and program operations -- Minimizes system level requirements s Manufactured on 0.32 m process technology -- Compatible with 0.5 m Am29F400 device s High performance -- Access times as fast as 45 ns s Low power consumption (typical values at 5 MHz) -- 1 A standby mode current -- 20 mA read current (byte mode) -- 28 mA read current (word mode) -- 30 mA program/erase current s Flexible sector architecture -- One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and seven 64 Kbyte sectors (byte mode) -- One 8 Kword, two 4 Kword, one 16 Kword, and seven 32 Kword sectors (word mode) -- Supports full chip erase -- Sector Protection features: A hardware method of locking a sector to prevent any program or erase operations within that sector Sectors can be locked via programming equipment Temporary Sector Unprotect feature allows code changes in previously locked sectors s Top or bottom boot block configurations available s Embedded Algorithms -- Embedded Erase algorithm automatically preprograms and erases the entire chip or any combination of designated sectors -- Embedded Program algorithm automatically writes and verifies data at specified addresses s Minimum 1,000,000 program/erase cycles per sector guaranteed s 20-year data retention at 125C -- Reliable operation for the life of the system s Package option -- 48-pin TSOP -- 44-pin SO -- Known Good Die (KGD) (see publication number 21258) s Compatibility with JEDEC standards -- Pinout and software compatible with singlepower-supply Flash -- Superior inadvertent write protection s Data# Polling and toggle bits -- Provides a software method of detecting program or erase operation completion s Ready/Busy# pin (RY/BY#) -- Provides a hardware method of detecting program or erase cycle completion s Erase Suspend/Erase Resume -- Suspends an erase operation to read data from, or program data to, a sector that is not being erased, then resumes the erase operation s Hardware reset pin (RESET#) -- Hardware method to reset the device to reading array data
This Data Sheet states AMD's current technical specifications regarding the Products described herein. This Data Sheet may be revised by subsequent versions or modifications due to changes in technical specifications.
Publication# 21505 Rev: E Amendment/+1 Issue Date: November 30, 2000
GENERAL DESCRIPTION
The AM29F400B is a 4 Mbit, 5.0 volt-only Flash memory organized as 524,288 bytes or 262,144 words. The device is offered in 44-pin SO and 48-pin TSOP packages. The device is also available in Known Good Die (KGD) form. For more information, refer to publication number 21258. The word-wide data (x16) appears on DQ15-DQ0; the byte-wide (x8) data appears on DQ7- DQ0. This device is designed to be programmed in-system with the standard system 5.0 volt VCC supply. A 12.0 V VPP is not required for write or erase operations. The device can also be programmed in standard EPROM programmers. This device is manufactured using AMD's 0.32 m process technology, and offers all the features and benefits of the Am29F400, which was manufactured using 0.5 m process technology. The standard device offers access times of 45, 50, 55, 70, 90, 120, and 150 ns, allowing high speed microprocessors to operate without wait states. To eliminate bus contention the device has separate chip enable (CE#), write enable (WE#) and output enable (OE#) controls. The device requires only a single 5.0 volt power supply for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. The device is entirely command set compatible with the JEDEC single-power-supply Flash standard. Commands are written to the command register using standard microprocessor write timings. Register contents serve as input to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices. Device programming occurs by executing the program command sequence. This initiates the Embedded Program algorithm--an internal algorithm that automatically times the program pulse widths and verifies proper cell margin. Device erasure occurs by executing the erase command sequence. This initiates the Embedded Erase algorithm--an internal algorithm that automatically preprograms the array (if it is not already programmed) before executing the erase operation. During erase, the device automatically times the erase pulse widths and verifies proper cell margin. The host system can detect whether a program or erase operation is complete by observing the RY/BY# pin, or by reading the DQ7 (Data# Polling) and DQ6/DQ2 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or accept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The hardware sector protection feature disables both program and erase operations in any combination of the sectors of memory. This can be achieved via programming equipment. The Erase Suspend feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. True background erase can thus be achieved. The hardware RESET# pin terminates any operation in progress and resets the internal state machine to reading array data. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read the boot-up firmware from the Flash memory. The system can place the device into the standby mode. Power consumption is greatly reduced in this mode. AMD's Flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. The device electrically erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection.
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AM29F400B
TABLE OF CONTENTS
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ordering Information . . . . . . . . . . . . . . . . . . . . . . . Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 4 4 5 6 6 7 8 Absolute Maximum Ratings. . . . . . . . . . . . . . . . . 22
Figure 6. Maximum Negative Overshoot Waveform ...................... 22 Figure 7. Maximum Positive Overshoot Waveform........................ 22
Table 1. AM29F400B Device Bus Operations .................................. 8
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 22 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 23 TTL/NMOS Compatible .......................................................... 23 CMOS Compatible .................................................................. 24 Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Figure 8. Test Setup....................................................................... 25 Table 7. Test Specifications ........................................................... 25
Word/Byte Configuration .......................................................... 8 Requirements for Reading Array Data ..................................... 8 Writing Commands/Command Sequences .............................. 8 Program and Erase Operation Status ...................................... 9 Standby Mode .......................................................................... 9 RESET#: Hardware Reset Pin ................................................. 9 Output Disable Mode ................................................................ 9
Table 2. AM29F400BT Top Boot Block Sector Address Table ....... 10 Table 3. AM29F400BB Bottom Boot Block Sector Address Table.. 10
Key to Switching Waveforms. . . . . . . . . . . . . . . . 25 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 26 Read Operations .................................................................... 26
Figure 9. Read Operations Timings ............................................... 26
Hardware Reset (RESET#) .................................................... 27
Figure 10. RESET# Timings .......................................................... 27
Word/Byte Configuration (BYTE#)
...................................... 28
Autoselect Mode ..................................................................... 10
Table 4. AM29F400B Autoselect Codes (High Voltage Method) .... 11
Figure 11. BYTE# Timings for Read Operations............................ 28 Figure 12. BYTE# Timings for Write Operations............................ 28
Sector Protection/Unprotection ............................................... 11 Temporary Sector Unprotect .................................................. 11
Figure 1. Temporary Sector Unprotect Operation........................... 11
Erase/Program Operations ..................................................... 29
Figure 13. Program Operation Timings.......................................... Figure 14. Chip/Sector Erase Operation Timings .......................... Figure 15. Data# Polling Timings (During Embedded Algorithms). Figure 16. Toggle Bit Timings (During Embedded Algorithms)...... Figure 17. DQ2 vs. DQ6................................................................. 30 31 32 32 33
Hardware Data Protection ...................................................... 12
Low VCC Write Inhibit ...................................................................... 12 Write Pulse "Glitch" Protection ........................................................ 12 Logical Inhibit .................................................................................. 12 Power-Up Write Inhibit .................................................................... 12
Temporary Sector Unprotect .................................................. 33
Figure 18. Temporary Sector Unprotect Timing Diagram .............. 33
Command Definitions . . . . . . . . . . . . . . . . . . . . . 13 Reading Array Data ................................................................ 13 Reset Command ..................................................................... 13 Autoselect Command Sequence ............................................ 13 Word/Byte Program Command Sequence ............................. 13
Figure 2. Program Operation .......................................................... 14
Alternate CE# Controlled Erase/Program Operations ............ 34
Figure 19. Alternate CE# Controlled Write Operation Timings ...... 35
Chip Erase Command Sequence ........................................... 14 Sector Erase Command Sequence ........................................ 14 Erase Suspend/Erase Resume Commands ........................... 16
Figure 3. Erase Operation............................................................... 16 Table 5. AM29F400B Command Definitions................................... 17
Write Operation Status . . . . . . . . . . . . . . . . . . . . 18 DQ7: Data# Polling ................................................................. 18
Figure 4. Data# Polling Algorithm ................................................... 18
RY/BY#: Ready/Busy# ........................................................... 19 DQ6: Toggle Bit I .................................................................... 19 DQ2: Toggle Bit II ................................................................... 19 Reading Toggle Bits DQ6/DQ2 .............................................. 19 DQ5: Exceeded Timing Limits ................................................ 20 DQ3: Sector Erase Timer ....................................................... 20
Figure 5. Toggle Bit Algorithm......................................................... 20 Table 6. Write Operation Status...................................................... 21
Erase and Programming Performance . . . . . . . . 36 Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 36 TSOP and SO Pin Capacitance . . . . . . . . . . . . . . 36 Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 37 TS 048--48-Pin Standard Thin Small Outline Package ......... 37 TSR048--48-Pin Reverse Thin Small Outline Package ......... 38 SO 044--44-Pin Small Outline Package ................................ 39 Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 40 Revision A (August 1997) ....................................................... 40 Revision B (October 1997) ..................................................... 40 Revision C (January 1998) ..................................................... 40 Revision C+1 (February 1998) ............................................... 40 Revision C+2 (April 1998) ....................................................... 40 Revision C+3 (June 1998) ...................................................... 40 Revision C+4 (August 1998) ................................................... 41 Revision D (January 1999) ..................................................... 41 Revision D+1 (July 2, 1999) ................................................... 41 Revision E (November 15, 1999) ............................................ 41 Revision E+1 (November 30, 2000) ....................................... 41
AM29F400B
3
PRODUCT SELECTOR GUIDE
Family Part Number Speed Option VCC = 5.0 V 5% VCC = 5.0 V 10% Max access time, ns (tACC) Max CE# access time, ns (tCE) Max OE# access time, ns (tOE) 45 45 30 50 50 30 -45 -50 -55 -55 55 55 30 -70 70 70 30 -90 90 90 35 -120 120 120 50 -150 150 150 55 AM29F400B
Note: See "AC Characteristics" for full specifications.
BLOCK DIAGRAM
RY/BY# VCC VSS RESET# Erase Voltage Generator Input/Output Buffers Sector Switches DQ0-DQ15 (A-1)
WE# BYTE#
State Control Command Register
PGM Voltage Generator Chip Enable Output Enable Logic STB Data Latch
CE# OE#
STB VCC Detector Timer Address Latch
Y-Decoder
Y-Gating
X-Decoder
Cell Matrix
A0-A17
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AM29F400B
CONNECTION DIAGRAMS
This device is also available in Known Good Die (KGD) form. Refer to publication number 21258 for more information.
A15 A14 A13 A12 A11 A10 A9 A8 NC NC WE# RESET# NC NC RY/BY# NC A17 A7 A6 A5 A4 A3 A2 A1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
48-Pin TSOP--Standard Pinout
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A16 BYTE# VSS DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# VSS CE# A0
A16 BYTE# VSS DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# VSS CE# A0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
48-Pin TSOP--Reverse Pinout
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A15 A14 A13 A12 A11 A10 A9 A8 NC NC WE# RESET# NC NC RY/BY# NC A17 A7 A6 A5 A4 A3 A2 A1
AM29F400B
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CONNECTION DIAGRAMS
This device is also available in Known Good Die (KGD) form. Refer to publication number 21258 for more information.
NC RY/BY# A17 A7 A6 A5 A4 A3 A2 A1 A0 CE# VSS OE# DQ0 DQ8 DQ1 DQ9 DQ2 DQ10 DQ3 DQ11
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
SO
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
RESET# WE# A8 A9 A10 A11 A12 A13 A14 A15 A16 BYTE# VSS DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC
PIN CONFIGURATION
A0-A17 = 18 addresses
18 A0-A17 DQ0-DQ15 (A-1) CE# OE# WE# RESET# BYTE# RY/BY# 16 or 8
DQ0-DQ14 = 15 data inputs/outputs DQ15/A-1 BYTE# CE# OE# WE# RESET# RY/BY# VCC = DQ15 (data input/output, word mode), A-1 (LSB address input, byte mode) = Selects 8-bit or 16-bit mode = Chip enable = Output enable = Write enable = Hardware reset pin, active low = Ready/Busy# output = +5.0 V single power supply (see Product Selector Guide for device speed ratings and voltage supply tolerances) = Device ground = Pin not connected internally
VSS NC
LOGIC SYMBOL
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AM29F400B
ORDERING INFORMATION Standard Products
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the elements below.
AM29F400B T -45 E C
OPTIONAL PROCESSING Blank = Standard Processing 0 = VCC = 5.0 V 10%, 55 ns device only (Contact an AMD representative for more information) TEMPERATURE RANGE C = Commercial (0C to +70C) I = Industrial (-40C to +85C) E = Extended (-55C to +125C) PACKAGE TYPE E = 48-Pin Thin Small Outline Package (TSOP) Standard Pinout (TS 048) F = 48-Pin Thin Small Outline Package (TSOP) Reverse Pinout (TSR048) S = 44-Pin Small Outline Package (SO 044) This device is also available in Known Good Die (KGD) form. See publication number 21258 for more information. SPEED OPTION See Product Selector Guide and Valid Combinations BOOT CODE SECTOR ARCHITECTURE T = Top sector B = Bottom sector DEVICE NUMBER/DESCRIPTION
AM29F400B 4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS Flash Memory 5.0 Volt-only Read, Program and Erase
Valid Combinations AM29F400BT-45, AM29F400BB-45, AM29F400BT-50, AM29F400BB-50 AM29F400BT-55, AM29F400BB-55 AM29F400BT-55, AM29F400BB-55 AM29F400BT-70, AM29F400BB-70 AM29F400BT-90, AM29F400BB-90 AM29F400BT-120, AM29F400BB-120 AM29F400BT-150, AM29F400BB-150 EC, EI, FC, FI, SC, SI
Voltage Range
Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales office to confirm availability of specific valid combinations and to check on newly released combinations.
5.0 V 5% EC, EI, EE, FC, FI, FE, SC, SI, SE
EC0, EI0, EE0, FC0, FI0, FE0, SC0, SI0, SE0
5.0 V 10% EC, EI, EE, FC, FI, FE, SC, SI, SE
AM29F400B
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DEVICE BUS OPERATIONS
This section describes the requirements and use of the device bus operations, which are initiated through the internal command register. The command register itself does not occupy any addressable memory location. The register is composed of latches that store the commands, along with the address and data information needed to execute the command. The contents of Table 1. the register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting output. The following subsections describe each of these operations in further detail.
AM29F400B Device Bus Operations
DQ8-DQ15 BYTE# = VIH DOUT DIN High-Z High-Z High-Z High-Z DIN BYTE# = VIL High-Z High-Z High-Z High-Z High-Z High-Z X
Operation Read Write CMOS Standby TTL Standby Output Disable Hardware Reset Temporary Sector Unprotect (See Note)
CE# L L VCC 0.5 V H L X X
OE# L H X X H X X
WE# H L X X H X X
RESET# H H VCC 0.5 V H H L VID
A0-A17 AIN AIN X X X X AIN
DQ0-DQ7 DOUT DIN High-Z High-Z High-Z High-Z DIN
Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 0.5 V, X = Don't Care, DIN = Data In, DOUT = Data Out, AIN = Address In Note:See the sections onSector Group Protection and Temporary Sector Unprotect for more information.
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O pins DQ15-DQ0 operate in the byte or word configuration. If the BYTE# pin is set at logic `1', the device is in word configuration, DQ15-DQ0 are active and controlled by CE# and OE#. If the BYTE# pin is set at logic `0', the device is in byte configuration, and only data I/O pins DQ0-DQ7 are active and controlled by CE# and OE#. The data I/O pins DQ8-DQ14 are tri-stated, and the DQ15 pin is used as an input for the LSB (A-1) address function.
valid addresses on the device address inputs produce valid data on the device data outputs. The device remains enabled for read access until the command register contents are altered. See "Reading Array Data" for more information. Refer to the AC Read Operations table for timing specifications and to Figure 9 for the timing diagram. ICC1 in the DC Characteristics table represents the active current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive WE# and CE# to VIL, and OE# to VIH. For program operations, the BYTE# pin determines whether the device accepts program data in bytes or words. Refer to "Word/Byte Configuration" for more information. An erase operation can erase one sector, multiple sectors, or the entire device. Tables 2 and 3 indicate the address space that each sector occupies. A "sector address" consists of the address bits required to uniquely select a sector. The "Command Definitions" section has details on erasing a sector or the entire chip, or suspending/resuming the erase operation.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the CE# and OE# pins to VIL. CE# is the power control and selects the device. OE# is the output control and gates array data to the output pins. WE# should remain at V IH . The BYTE# pin determines whether the device outputs array data in words or bytes. The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert
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AM29F400B
After the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on DQ7-DQ0. Standard read cycle timings apply in this mode. Refer to the "Autoselect Mode" and "Autoselect Command Sequence" sections for more information. ICC2 in the DC Characteristics table represents the active current specification for the write mode. The "AC Characteristics" section contains timing specification tables and timing diagrams for write operations.
In the CMOS and TTL/NMOS-compatible DC Characteristics tables, ICC3 represents the standby current specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of resetting the device to reading array data. When the RESET# pin is driven low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity. Current is reduced for the duration of the RESET# pulse. When RESET# is held at VIL, the device enters the TTL standby mode; if RESET# is held at VSS0.5 V, the device enters the CMOS standby mode. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory. If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a "0" (busy) until the internal reset operation is complete, which requires a time of tREADY (during Embedded Algorithms). The system can thus monitor RY/BY# to determine whether the reset operation is complete. If RESET# is asserted when a program or erase operation is not executing (RY/BY# pin is "1"), the reset operation is completed within a time of tREADY (not during Embedded Algorithms). The system can read data t RH after the RESET# pin returns to VIH. Refer to the AC Characteristics tables for RESET# parameters and to Figure 10 for the timing diagram.
Program and Erase Operation Status
During an erase or program operation, the system may check the status of the operation by reading the status bits on DQ7-DQ0. Standard read cycle timings and ICC read specifications apply. Refer to "The Erase Resume command is valid only during the Erase Suspend mode." for more information, and to "AC Characteristics" for timing diagrams.
Standby Mode
When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE# and RESET# pins are both held at VCC 0.5 V. (Note that this is a more restricted voltage range than VIH.) The device enters the TTL standby mode when CE# and RESET# pins are both held at VIH. The device requires standard access time (tCE) for read access when the device is in either of these standby modes, before it is ready to read data. The device also enters the standby mode when the RESET# pin is driven low. Refer to the next section, "RESET#: Hardware Reset Pin". If the device is deselected during erasure or programming, the device draws active current until the operation is completed.
Output Disable Mode
When the OE# input is at VIH, output from the device is disabled. The output pins are placed in the high impedance state.
AM29F400B
9
Table 2.
AM29F400BT Top Boot Block Sector Address Table
Address Range (in hexadecimal) Sector Size (Kbytes/ Kwords) 64/32 64/32 64/32 64/32 64/32 64/32 64/32 32/16 8/4 8/4 16/8 (x8) Address Range 00000h-0FFFFh 10000h-1FFFFh 20000h-2FFFFh 30000h-3FFFFh 40000h-4FFFFh 50000h-5FFFFh 60000h-6FFFFh 70000h-77FFFh 78000h-79FFFh 7A000h-7BFFFh 7C000h-7FFFFh (x16) Address Range 00000h-07FFFh 08000h-0FFFFh 10000h-17FFFh 18000h-1FFFFh 20000h-27FFFh 28000h-2FFFFh 30000h-37FFFh 38000h-3BFFFh 3C000h-3CFFFh 3D000h-3DFFFh 3E000h-3FFFFh
Sector SA0 SA1 SA2 SA3 SA4 SA5 SA6 SA7 SA8 SA9 SA10
A17 0 0 0 0 1 1 1 1 1 1 1
A16 0 0 1 1 0 0 1 1 1 1 1
A15 0 1 0 1 0 1 0 1 1 1 1
A14 X X X X X X X 0 1 1 1
A13 X X X X X X X X 0 0 1
A12 X X X X X X X X 0 1 X
Table 3.
AM29F400BB Bottom Boot Block Sector Address Table
Address Range (in hexadecimal) Sector Size (Kbytes/Kwords) 16/8 8/4 8/4 32/16 64/32 64/32 64/32 64/32 64/32 64/32 64/32 (x8) Address Range 00000h-03FFFh 04000h-05FFFh 06000h-07FFFh 08000h-0FFFFh 10000h-1FFFFh 20000h-2FFFFh 30000h-3FFFFh 40000h-4FFFFh 50000h-5FFFFh 60000h-6FFFFh 70000h-7FFFFh (x16) Address Range 00000h-01FFFh 02000h-02FFFh 03000h-03FFFh 04000h-07FFFh 08000h-0FFFFh 10000h-17FFFh 18000h-1FFFFh 20000h-27FFFh 28000h-2FFFFh 30000h-37FFFh 38000h-3FFFFh
Sector SA0 SA1 SA2 SA3 SA4 SA5 SA6 SA7 SA8 SA9 SA10
A17 0 0 0 0 0 0 0 1 1 1 1
A16 0 0 0 0 0 1 1 0 0 1 1
A15 0 0 0 0 1 0 1 0 1 0 1
A14 0 0 0 1 X X X X X X X
A13 0 1 1 X X X X X X X X
A12 X 0 1 X X X X X X X X
Note: Address range is A17:A-1 in byte mode and A17:A0 in word mode.See the "Word/Byte Configuration" section for more information.
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector protection verification, through identifier codes output on DQ7-DQ0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command register. When using programming equipment, the autoselect mode requires VID (11.5 V to 12.5 V) on address pin A9. Address pins A6, A1, and A0 must be as shown in Table 4. In addition, when verifying sector protection, the sector address must appear on the appropriate highest order address bits (see Tables 2 and 3). Table 4 shows the remaining address bits that are don't care. When all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on DQ7-DQ0. To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 5. This method does not require VID. See "Command Definitions" for details on using the autoselect mode.
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AM29F400B
Table 4.
AM29F400B Autoselect Codes (High Voltage Method)
A17 A11 to to WE# A12 A10 H H X X H H X X H VID X L X L H X ABh 01h (protected) 00h (unprotected) VID X L X L H X 22h 23h ABh X X A8 to A7 X A5 to A2 X DQ8 to DQ15 X 22h DQ7 to DQ0 01h 23h
Description
Mode
CE# L L L L L
OE# L L L L L
A9 VID
A6 L
A1 L
A0 L
Manufacturer ID: AMD Device ID: AM29F400B (Top Boot Block) Device ID: AM29F400B (Bottom Boot Block) Word Byte Word Byte
X Sector Protection Verification L L H SA X VID X L X H L X
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don't care.
Sector Protection/Unprotection
The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously protected sectors. Sector protection/unprotection must be implemented using programming equipment. The procedure requires a high voltage (VID ) on address pin A9 and OE#. Details on this method are provided in a supplement, publication number 20185. Contact an AMD representative to obtain a copy of this document. The device is shipped with all sectors unprotected. AMD offers the option of programming and protecting sectors at its factory prior to shipping the device through AMD's ExpressFlashTM Service. Contact an AMD representative for details. It is possible to determine whether a sector is protected or unprotected. See "Autoselect Mode" for details.
rithm, and Figure 18 shows the timing diagrams, for this feature.
START
RESET# = VID (Note 1) Perform Erase or Program Operations
RESET# = VIH
Temporary Sector Unprotect Completed (Note 2)
Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to change data in-system. The Sector Unprotect mode is activated by setting the RESET# pin to VID. During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from the RESET# pin, all the previously protected sectors are protected again. Figure 1 shows the algoNotes: 1. All protected sectors unprotected. 2. All previously protected sectors are protected once again.
Figure 1.
Temporary Sector Unprotect Operation
AM29F400B
11
Hardware Data Protection
The command sequence requirement of unlock cycles for programming or erasing provides data protection against inadver tent writes (refer to Table 5 for command definitions). In addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during VCC power-up and power-down transitions, or from system noise. Low VCC Write Inhibit When V CC is less than V LKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets. Subsequent writes are ignored until VCC is greater than V LKO. The system must provide the
proper signals to the control pins to prevent unintentional writes when VCC is greater than VLKO. Write Pulse "Glitch" Protection Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle. Logical Inhibit Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# = VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a logical one. Power-Up Write Inhibit If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to reading array data on power-up.
12
AM29F400B
COMMAND DEFINITIONS
Writing specific address and data commands or sequences into the command register initiates device operations. Table 5 defines the valid register command sequences. Writing incorrect address and data values or writing them in the improper sequence resets the device to reading array data. All addresses are latched on the falling edge of WE# or CE#, whichever happens later. All data is latched on the rising edge of WE# or CE#, whichever happens first. Refer to the appropriate timing diagrams in the "AC Characteristics" section. however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command must be written to return to reading array data (also applies to autoselect during Erase Suspend). If DQ5 goes high during a program or erase operation, writing the reset command returns the device to reading array data (also applies dur ing Erase Suspend).
Reading Array Data
The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. The device is also ready to read array data after completing an Embedded Program or Embedded Erase algorithm. After the device accepts an Erase Suspend command, the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erase-suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See "Erase Suspend/Erase Resume Commands" for more information on this mode. The system must issue the reset command to reenable the device for reading array data if DQ5 goes high, or while in the autoselect mode. See the "Reset Command" section, next. See also "Requirements for Reading Array Data" in the "Device Bus Operations" section for more information. The Read Operations table provides the read parameters, and Figure 9 shows the timing diagram.
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and devices codes, and determine whether or not a sector is protected. Table 5 shows the address and data requirements. This method is an alternative to that shown in Table 4, which is intended for PROM programmers and requires VID on address bit A9. The autoselect command sequence is initiated by writing two unlock cycles, followed by the autoselect command. The device then enters the autoselect mode, and the system may read at any address any number of times, without initiating another command sequence. A read cycle at address XX00h or retrieves the manufacturer code. A read cycle at address XX01h in word mode (or 02h in byte mode) returns the device code. A read cycle containing a sector address (SA) and the address 02h in word mode (or 04h in byte mode) returns 01h if that sector is protected, or 00h if it is unprotected. Refer to Tables 2 and 3 for valid sector addresses. The system must write the reset command to exit the autoselect mode and return to reading array data.
Reset Command
Writing the reset command to the device resets the device to reading array data. Address bits are don't care for this command. The reset command may be written between the sequence cycles in an erase command sequence before erasing begins. This resets the device to reading array data. Once erasure begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the device to reading array data (also applies to programming in Erase Suspend mode). Once programming begins,
Word/Byte Program Command Sequence
The system may program the device by word or byte, depending on the state of the BYTE# pin. Programming is a four-bus-cycle operation. The program command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and verify the programmed cell margin. Table 5 shows the address and data r e q u i re m en t s fo r th e byt e pr o gra m c om m a n d sequence. When the Embedded Program algorithm is complete, the device then returns to reading array data and 13
AM29F400B
addresses are no longer latched. The system can determine the status of the program operation by using DQ7, DQ6, or RY/BY#. See "The Erase Resume command is valid only during the Erase Suspend mode." for information on these status bits. Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the programm i n g o pe rati o n. T h e B yte Pr o gra m com m a n d sequence should be reinitiated once the device has reset to reading array data, to ensure data integrity. Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed from a "0" back to a "1". Attempting to do so may halt the operation and set DQ5 to "1", or cause the Data# Polling algorithm to indicate the operation was successful. However, a succeeding read will show that the data is still "0". Only erase operations can convert a "0" to a "1".
Chip Erase Command Sequence
Chip erase is a six-bus-cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 5 shows the address and data requirements for the chip erase command sequence. Any com mand s wr i tten to th e chip d ur ing th e Embedded Erase algorithm are ignored. Note that a hardware reset during the chip erase operation immediately terminates the operation. The Chip Erase command sequence should be reinitiated once the device has returned to reading array data, to ensure data integrity. The system can determine the status of the erase operation by using DQ7, DQ6, DQ2, or RY/BY#. See "The Erase Resume command is valid only during the Erase Suspend mode." for information on these status bits. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. Figure 3 illustrates the algorithm for the erase operation. See the "Erase/Program Operations" tables in "AC Characteristics" for parameters, and to Figure 14 for timing diagrams.
START
Write Program Command Sequence
Embedded Program algorithm in progress
Data Poll from System
Sector Erase Command Sequence
Verify Data? No
Yes No
Increment Address
Last Address?
Sector erase is a six bus cycle operation. The sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the address of the sector to be erased, and the sector erase command. Table 5 shows the address and data requirements for the sector erase command sequence. The device does not require the system to preprogram the memory prior to erase. The Embedded Erase algorithm automatically programs and verifies the sector for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. After the command sequence is written, a sector erase time-out of 50 s begins. During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than 50 s, otherwise the last address and command might not
Yes Programming Completed
Note: See Table 5 for program command sequence.
Figure 2.
Program Operation
14
AM29F400B
be accepted, and erasure may begin. It is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. The interrupts can be re-enabled after the last Sector Erase command is written. If the time between additional sector erase commands can be assumed to be less than 50 s, the system need not monitor DQ3. Any command other than Sector Erase or Erase Suspend during the time-out period resets the device to reading array data. The system must rewrite the command sequence and any additional sector addresses and commands. The system can monitor DQ3 to determine if the sector erase timer has timed out. (See the "DQ3: Sector Erase Timer" section.) The time-out begins from the rising edge of the final WE# pulse in the command sequence. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands
are ignored. Note that a hardware reset during the sector erase operation immediately terminates the operation. The Sector Erase command sequence should be reinitiated once the device has returned to reading array data, to ensure data integrity. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. The system can determine the status of the erase operation by using DQ7, DQ6, DQ2, or RY/BY#. (Refer to "The Erase Resume command is valid only during the Erase Suspend mode." for information on these status bits.) Figure 3 illustrates the algorithm for the erase operation. Refer to the "Erase/Program Operations" tables in the "AC Characteristics" section for parameters, and to Figure 14 for timing diagrams.
AM29F400B
15
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. This command is valid only during the sector erase operation, including the 50 s time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. Writing the Erase Suspend command during the Sector Erase time-out immediately terminates the time-out period and suspends the erase operation. Addresses are "don't-cares" when writing the Erase Suspend command. When the Erase Suspend command is written during a sector erase operation, the device requires a maximum of 20 s to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. After the erase operation has been suspended, the system can read array data from or program data to any sector not selected for erasure. (The device "erase suspends" all sectors selected for erasure.) Normal read and write timings and command definitions apply. Reading at any address within erase-suspended sectors produces status data on DQ7-DQ0. The system can use DQ7, or DQ6 and DQ2 together, to determine if a sector is actively erasing or is erase-suspended. See "The Erase Resume command is valid only during the Erase Suspend mode." for information on these status bits. After an erase-suspended program operation is complete, the system can once again read array data within non-suspended sectors. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. See "The Erase Resume command is valid only during the Erase Suspend mode." for more information. The system may also write the autoselect command sequence when the device is in the Erase Suspend mode. The device allows reading autoselect codes
even at addresses within erasing sectors, since the codes are not stored in the memory array. When the device exits the autoselect mode, the device reverts to the Erase Suspend mode, and is ready for another valid operation. See "Autoselect Command Sequence" for more information. The system must write the Erase Resume command (address bits are "don't care") to exit the erase suspend mode and continue the sector erase operation. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the device has resumed erasing.
START
Write Erase Command Sequence
Data Poll from System
Embedded Erase algorithm in progress
No
Data = FFh?
Yes Erasure Completed
Notes: 1. See Table 5 for erase command sequence. 2. See "DQ3: Sector Erase Timer" for more information.
Figure 3.
Erase Operation
16
AM29F400B
Table 5.
Command Sequence (Note 1) Read (Note 6) Reset (Note 7) Manufacturer ID Word Byte Word Byte Word Byte Word Sector Protect Verify (Note 9) Byte Program Chip Erase Sector Erase Erase Suspend (Note 10) Erase Resume (Note 11) Word Byte Word Byte Word Byte 4 6 6 1 1 4 AAA 555 AAA 555 AAA 555 AAA XXX XXX Cycles First Addr RA XXX 555 AAA 555 AAA 555 AAA 555
AM29F400B Command Definitions
Bus Cycles (Notes 2-5) Second Addr Data RD F0 AA AA AA 2AA 555 2AA 555 2AA 555 2AA AA 555 AA AA AA B0 30 2AA 555 2AA 555 2AA 555 55 55 55 55 AAA 555 AAA 555 AAA 555 AAA A0 80 80 55 55 55 555 AAA 555 AAA 555 AAA 555 90 (SA) X04 PA 555 AAA 555 AAA 90 90 90 X00 X01
X02
Third Addr
Fourth Data Addr Data
Fifth Addr Data
Sixth Addr Data
Data
1 1 4 4 4
01 2223 23 22AB AB XX00 XX01 00 01 PD AA AA 2AA 555 2AA 555 55 55 555 AAA SA 10 30
Autoselect (Note 8)
Device ID, Top Boot Block Device ID, Bottom Boot Block
X01
X02
(SA) X02
Legend: X = Don't care RA = Address of the memory location to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE# or CE# pulse, whichever happens later. PD = Data to be programmed at location PA. Data latches on the rising edge of WE# or CE# pulse, whichever happens first. SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A17-A12 uniquely select any sector.
Notes: 1. See Table 1 for description of bus operations. 2. All values are in hexadecimal. 3. Except when reading array or autoselect data, all bus cycles are write operations. 4. Data bits DQ15-DQ8 are don't cares for unlock and command cycles. 5. Address bits A17-A11 are don't cares for unlock and command cycles, unless PA or SA required. 6. No unlock or command cycles required when reading array data. 7. The Reset command is required to return to reading array data when device is in the autoselect mode, or if DQ5 goes high (while the device is providing status data).
8. The fourth cycle of the autoselect command sequence is a read cycle. 9. The data is 00h for an unprotected sector and 01h for a protected sector. See"Autoselect Command Sequence" for more information. 10. The system may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend mode. The Erase Suspend command is valid only during a sector erase operation. 11. The Erase Resume command is valid only during the Erase Suspend mode.
AM29F400B
17
WRITE OPERATION STATUS
The device provides several bits to determine the status of a write operation: DQ2, DQ3, DQ5, DQ6, DQ7, and RY/BY#. Table 6 and the following subsections describe the functions of these bits. DQ7, RY/BY#, and DQ6 each offer a method for determining whether a program or erase operation is complete or in progress. These three bits are discussed first. Table 6 shows the outputs for Data# Polling on DQ7. Figure 4 shows the Data# Polling algorithm.
START
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Algorithm is in progress or completed, or whether the device is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the program or erase command sequence. During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to programming during Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to DQ7. The system must provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# Polling on DQ7 is active for approximately 2 s, then the device returns to reading array data. During the Embedded Erase algorithm, Data# Polling produces a "0" on DQ7. When the Embedded Erase algorithm is complete, or if the device enters the Erase Suspend mode, Data# Polling produces a "1" on DQ7. This is analogous to the complement/true datum output described for the Embedded Program algorithm: the erase function changes all the bits in a sector to "1"; prior to this, the device outputs the "complement," or "0." The system must provide an address within any of the sectors selected for erasure to read valid status information on DQ7. After an erase command sequence is written, if all sectors selected for erasing are protected, Data# Polling on DQ7 is active for approximately 100 s, then the device returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. When the system detects DQ7 has changed from the complement to true data, it can read valid data at DQ7- DQ0 on the following read cycles. This is because DQ7 may change asynchronously with DQ0-DQ6 while Output Enable (OE#) is asserted low. Figure 15, Data# Polling Timings (During Embedded Algorithms), in the "AC Characteristics" section illustrates this.
Read DQ7-DQ0 Addr = VA
DQ7 = Data?
Yes
No No
DQ5 = 1?
Yes Read DQ7-DQ0 Addr = VA
DQ7 = Data?
Yes
No FAIL PASS
Notes: 1. VA = Valid address for programming. During a sector erase operation, a valid address is an address within any sector selected for erasure. During chip erase, a valid address is any non-protected sector address. 2. DQ7 should be rechecked even if DQ5 = "1" because DQ7 may change simultaneously with DQ5.
Figure 4.
Data# Polling Algorithm
18
AM29F400B
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output pin that indicates whether an Embedded Algorithm is in progress or complete. The RY/BY# status is valid after the rising edge of the final WE# pulse in the command sequence. Since RY/BY# is an open-drain output, several RY/BY# pins can be tied together in parallel with a pull-up resistor to VCC. If the output is low (Busy), the device is actively erasing or programming. (This includes programming in the Erase Suspend mode.) If the output is high (Ready), the device is ready to read array data (including during the Erase Suspend mode), or is in the standby mode. Table 6 shows the outputs for RY/BY#. Figures 10, Figure 13 and Figure 14 shows RY/BY# for reset, program, and erase operations, respectively.
Table 6 shows the outputs for Toggle Bit I on DQ6. Figure 5 shows the toggle bit algorithm. Figure 16 in the "AC Characteristics" section shows the toggle bit timing diagrams. Figure 17 shows the differences between DQ2 and DQ6 in graphical form. See also the subsection on "DQ2: Toggle Bit II".
DQ2: Toggle Bit II
The "Toggle Bit II" on DQ2, when used with DQ6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command sequence. DQ2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE# or CE# to control the read cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or is erase-suspended. DQ6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 6 to compare outputs for DQ2 and DQ6. Figure 5 shows the toggle bit algorithm in flowchart form, and the section "DQ2: Toggle Bit II" explains the algorithm. See also the "DQ6: Toggle Bit I" subsection. Figure 16 shows the toggle bit timing diagram. Figure 17 shows the differences between DQ2 and DQ6 in graphical form.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. The system may use either OE# or CE# to control the read cycles. When the operation is complete, DQ6 stops toggling. After an erase command sequence is written, if all sectors selected for erasing are protected, DQ6 toggles for approximately 100 s, then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erasesuspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on "DQ7: Data# Polling"). If a program address falls within a protected sector, DQ6 toggles for approximately 2 s after the program command sequence is written, then returns to reading array data. DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program algorithm is complete.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 5 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read DQ7-DQ0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ7-DQ0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. 19
AM29F400B
The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 5).
START
Read DQ7-DQ0
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions DQ5 produces a "1." This is a failure condition that indicates the program or erase cycle was not successfully completed. The DQ5 failure condition may appear if the system tries to program a "1" to a location that is previously programmed to "0." Only an erase operation can change a "0" back to a "1." Under this condition, the device halts the operation, and when the operation has exceeded the timing limits, DQ5 produces a "1." Under both these conditions, the system must issue the reset command to return the device to reading array data.
Read DQ7-DQ0
(Note 1)
Toggle Bit = Toggle? Yes
No
No
DQ5 = 1?
Yes
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the system may read DQ3 to determine whether or not an erase operation has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire timeout also applies after each additional sector erase command. When the time-out is complete, DQ3 switches from "0" to "1." If the time between additional sector erase commands from the system can be assumed to be less than 50 s, the system need not monitor DQ3. See also the "Sector Erase Command Sequence" section. After the sector erase command sequence is written, the system should read the status on DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure the device has accepted the command sequence, and then read DQ3. If DQ3 is "1", the internally controlled erase cycle has begun; all further commands (other than Erase Suspend) are ignored until the erase operation is complete. If DQ3 is "0", the device will accept additional sector erase commands. To ensure the command has been accepted, the system software should check the status of DQ3 prior to and following each subsequent sector
Read DQ7-DQ0 Twice
(Notes 1, 2)
Toggle Bit = Toggle?
No
Yes Program/Erase Operation Not Complete, Write Reset Command Program/Erase Operation Complete
Notes: 1. Read toggle bit twice to determine whether or not it is toggling. See text. 2. Recheck toggle bit because it may stop toggling as DQ5 changes to "1". See text.
Figure 5.
Toggle Bit Algorithm
erase command. If DQ3 is high on the second status check, the last command might not have been accepted. Table 6 shows the outputs for DQ3.
20
AM29F400B
Table 6.
Operation Standard Mode Erase Suspend Mode Embedded Program Algorithm Embedded Erase Algorithm Reading within Erase Suspended Sector Reading within Non-Erase Suspended Sector Erase-Suspend-Program
Write Operation Status
DQ6 Toggle Toggle No toggle Data Toggle DQ5 (Note 1) 0 0 0 Data 0 DQ3 N/A 1 N/A Data N/A DQ2 (Note 2) No toggle Toggle Toggle Data N/A RY/BY# 0 0 1 1 0
DQ7 (Note 2) DQ7# 0 1 Data DQ7#
Notes: 1. DQ5 switches to `1' when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. See "DQ5: Exceeded Timing Limits" for more information. 2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.
AM29F400B
21
ABSOLUTE MAXIMUM RATINGS
Storage Temperature Plastic Packages . . . . . . . . . . . . . . . -65C to +150C Ambient Temperature with Power Applied. . . . . . . . . . . . . . -55C to +125C Voltage with Respect to Ground VCC (Note 1) . . . . . . . . . . . . . . . .-2.0 V to +7.0 V A9, OE#, and RESET# (Note 2). . . . . . . . . . . . -2.0 V to +12.5 V All other pins (Note 1) . . . . . . . . . -0.5 V to +7.0 V Output Short Circuit Current (Note 3) . . . . . . 200 mA
Notes: 1. Minimum DC voltage on input or I/O pins is -0.5 V. During voltage transitions, input or I/O pins may overshoot VSS to -2.0 V for periods of up to 20 ns. See Figure 6. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns. See Figure 7. 2. Minimum DC input voltage on pins A9, OE#, and RESET# is -0.5 V. During voltage transitions, A9, OE#, and RESET# may overshoot VSS to -2.0 V for periods of up to 20 ns. See Figure 6. Maximum DC input voltage on pin A9 is +12.5 V which may overshoot to +13.5 V for periods up to 20 ns. 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second. Note:Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability.
VCC +2.0 V VCC +0.5 V 2.0 V 20 ns 20 ns 20 ns +0.8 V -0.5 V -2.0 V 20 ns 20 ns
Figure 6. Maximum Negative Overshoot Waveform
20 ns
Figure 7. Maximum Positive Overshoot Waveform
OPERATING RANGES
Commercial (C) Devices Ambient Temperature (TA) . . . . . . . . . . . 0C to +70C Industrial (I) Devices Ambient Temperature (TA) . . . . . . . . . -40C to +85C Extended (E) Devices Ambient Temperature (TA) . . . . . . . . -55C to +125C VCC Supply Voltages VCC for 5% devices . . . . . . . . . . .+4.75 V to +5.25 V VCC for 10% devices . . . . . . . . . . . .+4.5 V to +5.5 V
Note:Operating ranges define those limits between which the functionality of the device is guaranteed.
22
AM29F400B
DC CHARACTERISTICS TTL/NMOS Compatible
Parameter ILI ILIT ILO Description Input Load Current A9, OE#, RESET# Input Load Current Output Leakage Current Test Conditions VIN = VSS to VCC, VCC = VCC max VCC = VCC max; A9, OE#, RESET# = 12.5 V VOUT = VSS to VCC, VCC = VCC max CE# = VIL, OE# = VIH, f = 5 MHz, Byte Mode CE# = VIL, OE# = VIH, f = 5 MHz, Word Mode CE# = VIL, OE# = VIH CE#, RESET#, and OE# = VIH -0.5 2.0 VCC = 5.0 V IOL = 5.8 mA, VCC = VCC min IOH = -2.5 mA, VCC = VCC min 2.4 3.2 4.2 11.5 19 19 36 0.4 Min Typ Max 1.0 50 1.0 40 50 60 1 0.8 VCC +0.5 12.5 0.45 Unit A A A mA mA mA mA V V V V V V
ICC1
VCC Active Read Current (Notes 1, 2)
ICC2 ICC3 VIL VIH VID VOL VOH VLKO
VCC Active Write Current (Notes 2, 3, 4) VCC Standby Current (Note 2) Input Low Voltage Input High Voltage Voltage for Autoselect and Temporary Sector Unprotect Output Low Voltage Output High Voltage Low VCC Lock-Out Voltage
Notes: 1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.. 2. Maximum ICC specifications are tested with VCC = VCCmax. 3. ICC active while Embedded Erase or Embedded Program is in progress. 4. Not 100% tested.
AM29F400B
23
DC CHARACTERISTICS CMOS Compatible
Parameter ILI ILIT ILO Description Input Load Current A9, OE#, RESET# Input Load Current Output Leakage Current Test Conditions VIN = VSS to VCC, VCC = VCC max VCC = VCC max; A9, OE#, RESET# = 12.5 V VOUT = VSS to VCC, VCC = VCC max CE# = VIL, OE# = VIH, f = 5 MHz, Byte Mode CE# = VIL, OE# = VIH, f = 5 MHz, Word Mode CE# = VIL, OE# = VIH OE# = VIH, CE# and RESET# = VCC0.5 V -0.5 0.7 x VCC VCC = 5.0 V IOL = 5.8 mA, VCC = VCC min IOH = -2.5 mA, VCC = VCC min Output High Voltage VOH2 VLKO Low VCC Lock-Out Voltage IOH = -100 A, VCC = VCC min 0.85 VCC VCC- 0.4 3.2 4.2 V 11.5 20 28 30 0.3 Min Typ Max 1.0 50 1.0 40 mA 50 50 5 0.8 VCC+ 0.3 12.5 0.45 mA A V V V V V Unit A A A
ICC1
VCC Active Read Current (Notes 1, 2)
ICC2 ICC3 VIL VIH VID VOL VOH1
VCC Active Write Current (Notes 2, 3, 4) VCC Standby Current (Notes 2, 5 Input Low Voltage Input High Voltage Voltage for Autoselect and Temporary Sector Unprotect Output Low Voltage
Notes: 1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. 2. Maximum ICC specifications are tested with VCC = VCCmax. 3. ICC active while Embedded Erase or Embedded Program is in progress. 4. Not 100% tested. 5. ICC3 = 20 A max at extended temperature (>+85 C).
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AM29F400B
TEST CONDITIONS
Table 7.
5.0 V Test Condition Device Under Test CL 6.2 k Input Rise and Fall Times Input Pulse Levels Input timing measurement reference levels 5 0.0-3.0 1.5 1.5 20 0.45-2.4 0.8, 2.0 0.8, 2.0 ns V V V 2.7 k Output Load Output Load Capacitance, CL (including jig capacitance) 30 -45, -50, -55 All others Unit
Test Specifications
1 TTL gate 100 pF
Note: Diodes are IN3064 or equivalent.
Output timing measurement reference levels
Figure 8.
Test Setup
KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS Steady Changing from H to L Changing from L to H Don't Care, Any Change Permitted Does Not Apply Changing, State Unknown Center Line is High Impedance State (High Z) OUTPUTS
AM29F400B
25
AC CHARACTERISTICS Read Operations
Parameter JEDEC tAVAV tAVQV tELQV tGLQV tEHQZ tGHQZ Std tRC tACC tCE tOE tDF tDF Description Read Cycle Time (Note 1) Address to Output Delay Chip Enable to Output Delay Output Enable to Output Delay Chip Enable to Output High Z (Note 1) Output Enable to Output High Z (Note 1) Output Enable Hold Time (Note 1) Read Toggle and Data# Polling CE# = VIL OE# = VIL OE# = VIL Test Setup Min Max Max Max Max Max Min Min -45 45 45 45 30 15 15 -50 50 50 50 30 15 15 Speed Options -55 55 55 55 30 15 15 -70 70 70 70 30 20 20 0 10 -90 90 90 90 35 20 20 -120 120 120 120 50 30 30 -150 150 150 150 55 35 35 Unit ns ns ns ns ns ns ns ns
tOEH
tAXQX
tOH
Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (Note 1)
Min
0
ns
Notes: 1. Not 100% tested. 2. See Figure 8 and Table 7 for test specifications.
tRC Addresses CE# tOE tOEH WE# HIGH Z Outputs RESET# RY/BY# Output Valid tCE tOH HIGH Z tDF Addresses Stable tACC
OE#
0V
Figure 9.
Read Operations Timings
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AM29F400B
AC CHARACTERISTICS Hardware Reset (RESET#)
Parameter JEDEC Std tREADY tREADY tRP tRH tRB Description RESET# Pin Low (During Embedded Algorithms) to Read or Write (See Note) RESET# Pin Low (NOT During Embedded Algorithms) to Read or Write (See Note) RESET# Pulse Width RESET# High Time Before Read (See Note) RY/BY# Recovery Time Test Setup Max Max Min Min Min All Speed Options 20 500 500 50 0 Unit s ns ns ns ns
Note: Not 100% tested.
RY/BY#
CE#, OE# tRH RESET# tRP tReady
Reset Timings NOT during Embedded Algorithms Reset Timings during Embedded Algorithms
tReady RY/BY# tRB CE#, OE#
RESET# tRP
Figure 10.
RESET# Timings
AM29F400B
27
AC CHARACTERISTICS Word/Byte Configuration (BYTE#)
Parameter JEDEC Std Description Max Max Min 15 45 15 50 15 55 -45 -50 Speed Options -55 -70 5 20 70 20 90 30 120 35 150 -90 -120 -150 Unit ns ns ns
tELFL/tELFH CE# to BYTE# Switching Low or High tFLQZ tFHQV BYTE# Switching Low to Output HIGH Z BYTE# Switching High to Output Active
CE#
OE#
BYTE# tELFL DQ0-DQ14
BYTE# Switching from word to byte mode
Data Output (DQ0-DQ14)
Data Output (DQ0-DQ7) Address Input
DQ15/A-1
DQ15 Output tFLQZ tELFH
BYTE# BYTE# Switching from byte to word mode
DQ0-DQ14
Data Output (DQ0-DQ7) Address Input tFHQV
Data Output (DQ0-DQ14) DQ15 Output
DQ15/A-1
Figure 11.
BYTE# Timings for Read Operations
CE# The falling edge of the last WE# signal WE#
BYTE#
tSET (tAS)
tHOLD (tAH)
Note: Refer to the Erase/Program Operations table for tAS and tAH specifications.
Figure 12.
BYTE# Timings for Write Operations
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AM29F400B
AC CHARACTERISTICS Erase/Program Operations
Parameter JEDEC tAVAV tAVWL tWLAX tDVWH tWHDX Std tWC tAS tAH tDS tDH tOES tGHWL tELWL tWHEH tWLWH tWHWL tWHWH1 tWHWH2 tGHWL tCS tCH tWP tWPH tWHWH1 Description Write Cycle Time (Note 1) Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recovery Time Before Write (OE# High to WE# Low) CE# Setup Time CE# Hold Time Write Pulse Width Write Pulse Width High Programming Operation (Note 2) Byte Word Min Min Min Min Min Min Min Min Min Min Min Typ Typ Typ Min Min Min 30 30 30 30 30 30 45 25 45 25 45 25 -45 45 -50 50 Speed Options -55 55 -70 70 0 45 30 0 0 0 0 0 35 20 7 s 12 1 50 0 30 35 50 55 sec s ns ns 45 50 50 45 45 50 50 50 50 -90 90 -120 120 -150 150 Unit ns ns ns ns ns ns ns ns ns ns ns
tWHWH2 Sector Erase Operation (Note 2) tVCS tRB tBUSY VCC Setup Time (Note 1) Recovery Time from RY/BY# Program/Erase Valid to RY/BY# Delay
Notes: 1. Not 100% tested. 2. See the "Erase and Programming Performance" section for more information.
AM29F400B
29
AC CHARACTERISTICS
Program Command Sequence (last two cycles) tAS tWC Addresses 555h PA tAH CE# OE# tWP WE# tCS tDS Data tDH PD tBUSY RY/BY# tVCS VCC Status DOUT tRB tWPH tWHWH1 Read Status Data (last two cycles)
PA
PA
tCH
A0h
Notes: 1. PA = program address, PD = program data, DOUT is the true data at the program address. 2. Illustration shows device in word mode.
Figure 13.
Program Operation Timings
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AM29F400B
AC CHARACTERISTICS
Erase Command Sequence (last two cycles) tAS tWC Addresses 2AAh SA
555h for chip erase
Read Status Data VA VA
tAH CE#
OE# tWP WE# tCS tDS
tCH
tWPH
tWHWH2
tDH Data 55h 30h
10 for Chip Erase In Progress Complete
tBUSY RY/BY# tVCS VCC
tRB
Notes: 1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see "Write Operation Status"). 2. Illustration shows device in word mode.
Figure 14.
Chip/Sector Erase Operation Timings
AM29F400B
31
AC CHARACTERISTICS
tRC Addresses VA tACC tCE CE# tCH OE# tOEH WE# tOH DQ7
High Z
VA
VA
tOE tDF
Complement
Complement
True
Valid Data
High Z
DQ0-DQ6 tBUSY RY/BY#
Status Data
Status Data
True
Valid Data
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle.
Figure 15.
Data# Polling Timings (During Embedded Algorithms)
tRC Addresses VA tACC tCE CE# tCH OE# tOEH WE# tOH DQ6/DQ2 tBUSY RY/BY#
High Z
VA
VA
VA
tOE tDF
Valid Status (first read)
Valid Status (second read)
Valid Status (stops toggling)
Valid Data
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle.
Figure 16.
Toggle Bit Timings (During Embedded Algorithms)
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AM29F400B
AC CHARACTERISTICS
Enter Embedded Erasing WE# Erase Suspend Erase Enter Erase Suspend Program Erase Suspend Program Erase Resume Erase Suspend Read Erase Erase Complete
Erase Suspend Read
DQ6
DQ2
Note: The system may use either CE# or OE# to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within an erase-suspended sector.
Figure 17.
DQ2 vs. DQ6
Temporary Sector Unprotect
Parameter JEDEC Std tVIDR tRSP Description VID Rise and Fall Time (See Note) RESET# Setup Time for Temporary Sector Unprotect Min Min All Speed Options 500 4 Unit ns s
Note: Not 100% tested.
12 V
RESET# 0 or 5 V tVIDR Program or Erase Command Sequence CE# tVIDR 0 or 5 V
WE# tRSP RY/BY#
Figure 18.
Temporary Sector Unprotect Timing Diagram
AM29F400B
33
AC CHARACTERISTICS Alternate CE# Controlled Erase/Program Operations
Parameter JEDEC tAVAV tAVEL tELAX tDVEH tEHDX Std tWC tAS tAH tDS tDH tOES tGHEL tWLEL tEHWH tELEH tEHEL tWHWH1 tWHWH2 tGHEL tWS tWH tCP tCPH tWHWH1 tWHWH2 Description Write Cycle Time (Note 1) Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recovery Time Before Write (OE# High to WE# Low) WE# Setup Time WE# Hold Time CE# Pulse Width CE# Pulse Width High Programming Operation (Note 2) Byte Word Min Min Min Min Min Min Min Min Min Min Min Typ Typ Typ 30 30 30 45 25 45 25 45 25 -45 45 -50 50 Speed Options -55 55 -70 70 0 45 30 0 0 0 0 0 35 20 7 s 12 1 sec 45 50 50 45 45 50 50 50 50 -90 90 -120 120 -150 150 Unit ns ns ns ns ns ns ns ns ns ns ns
Sector Erase Operation (Note 2)
Notes: 1. Not 100% tested. 2. See the "Erase and Programming Performance" section for more information.
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AM29F400B
AC CHARACTERISTICS
555 for program 2AA for erase PA for program SA for sector erase 555 for chip erase
Data# Polling PA
Addresses tWC tWH WE# tGHEL OE# tCP CE# tWS tCPH tDS tDH Data tRH
A0 for program 55 for erase PD for program 30 for sector erase 10 for chip erase
tAS tAH
tWHWH1 or 2
tBUSY
DQ7#
DOUT
RESET#
RY/BY#
Notes: 1. PA = Program Address, PD = Program Data, SA = Sector Address, DQ7# = Complement of Data Input, DOUT = Array Data. 2. Figure indicates the last two bus cycles of the command sequence, with the device in word mode.
Figure 19.
Alternate CE# Controlled Write Operation Timings
AM29F400B
35
ERASE AND PROGRAMMING PERFORMANCE
Parameter Sector Erase Time Chip Erase Time Byte Programming Time Word Programming Time Chip Programming Time (Note 3) Byte Mode Word Mode Typ (Note 1) 1.0 11 7 12 3.6 3.1 300 500 10.8 9.3 Max (Note 2) 8 Unit s s s s s s Excludes system level overhead (Note 5) Comments Excludes 00h programming prior to erasure
Notes: 1. Typical program and erase times assume the following conditions: 25C, 5.0 V VCC, 1,000,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90C, VCC = 4.5 V, 1,000,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the four-bus-cycle sequence for the program command. See Table 5 for further information on command definitions. 6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.
LATCHUP CHARACTERISTICS
Description Input voltage with respect to VSS on all pins except I/O pins (including A9, OE#, and RESET#) Input voltage with respect to VSS on all I/O pins VCC Current Min -1.0 V -1.0 V -100 mA Max 12.5 V VCC + 1.0 V +100 mA
Includes all pins except VCC. Test conditions: VCC = 5.0 V, one pin at a time.
TSOP AND SO PIN CAPACITANCE
Parameter Symbol CIN COUT CIN2 Parameter Description Input Capacitance Output Capacitance Control Pin Capacitance Test Setup VIN = 0 VOUT = 0 VIN = 0 Typ 6 8.5 7.5 Max 7.5 12 9 Unit pF pF pF
Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25C, f = 1.0 MHz.
DATA RETENTION
Parameter Minimum Pattern Data Retention Time 125C 20 Years Test Conditions 150C Min 10 Unit Years
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AM29F400B
PHYSICAL DIMENSIONS TS 048--48-Pin Standard Thin Small Outline Package
Dwg rev AA; 10/99
AM29F400B
37
PHYSICAL DIMENSIONS TSR048--48-Pin Reverse Thin Small Outline Package
Dwg rev AA; 10/99
38
AM29F400B
PHYSICAL DIMENSIONS SO 044--44-Pin Small Outline Package
Dwg rev AC; 10/99
AM29F400B
39
REVISION SUMMARY Revision A (August 1997)
Initial release.
Revision C (January 1998)
Global Formatted for consistency with other 5.0 volt-only data sheets. AC Characteristics Changed tDF and TFLQZ to 15 ns for -55 speed option.
Revision B (October 1997)
Global Added -55 and -60 speed options, deleted -65 speed option. Changed data sheet designation from Advance Information to Preliminary. Connection Diagrams Corrected pinouts on all packages: deleted A18. Table 1, Device Bus Operations Revised to indicate inputs for both CE# and RESET# are required for standby mode. Sector Protection/Unprotection Corrected text to indicate that these functions can only be implemented using programming equipment. Program Command Sequence Changed to indicate Data# Polling is active for 2 s after a program command sequence if the sector specified is protected. Sector Erase Command Sequence and DQ3: Sector Erase Timer Corrected sector erase timeout to 50 s. Erase Suspend Command Changed to indicate that the device suspends the erase operation a maximum of 20 s after the rising edge of WE#. DC Characteristics Changed to indicate VID min and max values are 11.5 to 12.5 V,with a VCC test condition of 5.0 V. Revised ILIT to 50 A. Added ICC4 specification. Added typical values to TTL/NMOS table. Revised CMOS typical standby current (ICC3). Figure 14: Chip/Sector Erase Operation Timings; Figure 19: Alternate CE# Controlled Write Operation TImings Corrected hexadecimal values in address and data waveforms. AC Characteristics, Erase/Program Operations Corrected tAH specification for -90 speed option to 45 ns. Erase and Programming Performance Corrected word and chip programming times.
Revision C+1 (February 1998)
Table 2, Top Boot Block Sector Address Table Corrected the sector size for SA10 to 16 Kbytes/ 8 Kwords. DC Characteristics--TTL/NMOS Compatible Deleted Note 4.
Revision C+2 (April 1998)
Distinctive Characteristics Changed minimum 100K write/erase cycles guaranteed to 1,000,000. Product Selector Guide, Ordering Information Added 55 ns 10% speed option. AC Characteristics Word/Byte Configuration: Changed tFHQV specification for 55 ns device.
Erase/Program Operations: Changed t WHWH1 word mode specification to 12 s. Corrected the notes reference for tWHWH1 and tWHWH2. These parameters are 100% tested. Corrected the note reference for tVCS. This parameter is not 100% tested.
Changed tDS and tCP specifications for 55 ns device.
Alternate CE# Controlled Erase/Program Operations: Changed tWHWH1 word mode specification to 12 s. Corrected the notes reference for tWHWH1 and tWHWH2. These parameters are 100% tested.
Changed tDS and tCP specifications for 55 ns device. Temporary Sector Unprotect Table Added note reference for tVIDR. This parameter is not 100% tested. Erase and Programming Performance Changed minimum 100K program and erase cycles guaranteed to 1,000,000.
Revision C+3 (June 1998)
Distinctive Characteristics
High Performance: Changed "Access times as fast as 55 ns" to "Access times as fast as 45 ns".
40
AM29F400B
General Description Third paragraph: Added 45 ns to access times. Product Selector Guide Added the -45 speed option for VCC = 5.0 V 5% and the -55 speed option for VCC = 5.0 V 10%. Ordering Information Added "Special Designation" to "Optional Processing" heading; added "0" for 55 ns 10% VCC, deleted burn-in. Burn-in is available by contacting an AMD representative. Added -55 10% and -45 speed options to the list of valid combinations. Added extended temperature ratings to -55 5% valid combinations. Table 1, Device Bus Operations Changed the BYTE#=VIL input for DQ8-DQ15 during temporary sector unprotect to "don't care" (X). Figure 6. Maximum Negative Undershoot Waveform Corrected figure title. Table 7, Test Specifications Test load capacitance: Removed 55 ns speed option from and added -45 speed option to the 30 pF. DC Characteristics Removed VCC = VCC max test condition for ICC1 - ICC3. VCC max is only valid for max specs. AC Characteristics Added the -45 speed option.
Revision D (January 1999)
Distinctive Characteristics Added: s 20-year data retention at 125C -- Reliable operation for the life of the system DC Characteristics--TTL/NMOS Compatible
ICC1, ICC2, ICC3: Added Note 2 "Maximum ICC specifications are tested with VCC = VCCmax".
DC Characteristics--CMOS Compatible
ICC1, ICC2, ICC3: Added Note 2 "Maximum ICC specifications are tested with VCC = VCCmax".
Erase and Programming Performance Deleted "(4.75 V for -45 and -55xx0)" from Note 2.
Revision D+1 (July 2, 1999)
Global Added references to availability of device in Known Good Die (KGD) form.
Revision E (November 15, 1999)
AC Characteristics--Figure 13. Program Operations Timing and Figure 14. Chip/Sector Erase Operations Deleted tGHWL and changed OE# waveform to start at high. Physical Dimensions Replaced figures with more detailed illustrations.
Revision C+4 (August 1998)
Ordering Information Added extended temperature combinations to the -55, 10% speed option. Deleted the -60 speed option.
Revision E+1 (November 30, 2000)
Added table of contents. Reinserted revision summaries for revisions A and B.
Trademarks
Copyright (c) 2000 Advanced Micro Devices, Inc. All rights reserved. AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc. ExpressFlashTM is a trademark of Advanced Micro Devices, Inc. Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
AM29F400B
41

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